X-ray optical system with wobble device

An X-ray optical system comprising an X-ray source ( 1 ), from which X-ray radiation ( 2 ) is guided to a sample ( 4 ) under investigation, and an X-ray detector ( 7 ) for receiving radiation ( 5 ) diffracted or scattered from the sample ( 4 ), wherein a beam-guiding X-ray optical element ( 3, 6 ), such as e.g. a collimator, a mono- or polycapillary, an X-ray mirror or a monochromator, is disposed between the source ( 1 ) and the sample ( 4 ) and/or between the sample ( 4 ) and the detector ( 7 ), is characterized in that a wobble means is provided for moving the X-ray optical element ( 3, 6 ) in an oscillating fashion during the measurement. The inventive X-ray optical system obtains averaged X-ray analysis information from objects under investigation having large mass which consist of macrocrystalline material without destroying or accelerating the object under investigation.