Multi-function probe card
A multi-function probe card ( 40 ) includes a PCB ( 41 ), a plurality of probe needles ( 47 ), a counter ( 71 ) to acquire a "piece sequence parameter", a signal-measuring device ( 72 ) via the probe needles ( 71 ) to acquire a current, and a voltage parameters etc. as well as a parametric...
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Format: | Patent |
Sprache: | eng |
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Zusammenfassung: | A multi-function probe card ( 40 ) includes a PCB ( 41 ), a plurality of probe needles ( 47 ), a counter ( 71 ) to acquire a "piece sequence parameter", a signal-measuring device ( 72 ) via the probe needles ( 71 ) to acquire a current, and a voltage parameters etc. as well as a parametric processing system ( 74 ). The parametric processing system ( 74 ) includes an I/O unit ( 51 )/( 59 ), a processing unit ( 52 ), a time providing unit ( 55 ), a real time display unit ( 56 ), and a storing unit ( 57 ). Moreover, the piece sequence parameter, current parameter, and voltage parameter can be input into the processing unit ( 52 ) through the I/O unit ( 51 )/( 59 ). Thereafter, a parametric data structure can be set up to record and calculate in accordance with the datum and parameters, and finally to display service processes and conditions of the probe card ( 40 ) through the real time display unit ( 56 ). |
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