Plasmon resonance phase imaging
A device for measuring simultaneously the phase at each point of an image formed by light reflected from a sample in which the phase has been modified by plasma resonance in a thin conducting layer, the device comprising a thick transparent substrate ( 10 ) on which a thin layer of conducting materi...
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| Format: | Patent |
| Sprache: | eng |
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| Zusammenfassung: | A device for measuring simultaneously the phase at each point of an image formed by light reflected from a sample in which the phase has been modified by plasma resonance in a thin conducting layer, the device comprising a thick transparent substrate ( 10 ) on which a thin layer of conducting material is deposited ( 13 ); a light source ( 1 ); an interferometer; an imaging means ( 9 ); and a processing means. |
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