Reducing time to measure constraint parameters of components in an integrated circuit

Reducing the time required to measure constraint parameters (setup time, hold time and pulse width) of components in integrated circuits. For example, the delay of propagation of a signal between an input node and an intermediate node of a component are measured. An approximate range of possible val...

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Hauptverfasser:	BHOWMIK SURAVI, KATLA SREEKANTHA MADHAVA, PRASAD VIKAS K, SHAH KALPESH AMRUTHLAL
Format:	Patent
Sprache:	eng
Schlagworte:	CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING PHYSICS
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creator	BHOWMIK SURAVI KATLA SREEKANTHA MADHAVA PRASAD VIKAS K SHAH KALPESH AMRUTHLAL
description	Reducing the time required to measure constraint parameters (setup time, hold time and pulse width) of components in integrated circuits. For example, the delay of propagation of a signal between an input node and an intermediate node of a component are measured. An approximate range of possible values is formulated, and a search (by applying signals assuming one of the values in the approximate range and examining the output signal(s)) is conducted within the range to determine the value of the constraint parameters.
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fullrecord	<record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US6904579B2</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US6904579B2</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US6904579B23</originalsourceid><addsrcrecordid>eNqNijsOwjAQBd1QIOAOewEkxFdpQSBqIHW0cl6ileK1Za_vTwoOQDNTzCxd-0JfvehIJgFkkQK41AzyUYtlFjVKnDnAkAvFYQ4hRYVaIVFinWkYMxt68pJ9FVu7xcBTwebnlaPH_XN7bpFih5LYQ2Fd-z43u-Pp0lz3hz-WL6yOOYc</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Reducing time to measure constraint parameters of components in an integrated circuit</title><source>esp@cenet</source><creator>BHOWMIK SURAVI ; KATLA SREEKANTHA MADHAVA ; PRASAD VIKAS K ; SHAH KALPESH AMRUTHLAL</creator><creatorcontrib>BHOWMIK SURAVI ; KATLA SREEKANTHA MADHAVA ; PRASAD VIKAS K ; SHAH KALPESH AMRUTHLAL</creatorcontrib><description>Reducing the time required to measure constraint parameters (setup time, hold time and pulse width) of components in integrated circuits. For example, the delay of propagation of a signal between an input node and an intermediate node of a component are measured. An approximate range of possible values is formulated, and a search (by applying signals assuming one of the values in the approximate range and examining the output signal(s)) is conducted within the range to determine the value of the constraint parameters.</description><edition>7</edition><language>eng</language><subject>CALCULATING ; COMPUTING ; COUNTING ; ELECTRIC DIGITAL DATA PROCESSING ; PHYSICS</subject><creationdate>2005</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20050607&DB=EPODOC&CC=US&NR=6904579B2$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76289</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20050607&DB=EPODOC&CC=US&NR=6904579B2$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>BHOWMIK SURAVI</creatorcontrib><creatorcontrib>KATLA SREEKANTHA MADHAVA</creatorcontrib><creatorcontrib>PRASAD VIKAS K</creatorcontrib><creatorcontrib>SHAH KALPESH AMRUTHLAL</creatorcontrib><title>Reducing time to measure constraint parameters of components in an integrated circuit</title><description>Reducing the time required to measure constraint parameters (setup time, hold time and pulse width) of components in integrated circuits. For example, the delay of propagation of a signal between an input node and an intermediate node of a component are measured. An approximate range of possible values is formulated, and a search (by applying signals assuming one of the values in the approximate range and examining the output signal(s)) is conducted within the range to determine the value of the constraint parameters.</description><subject>CALCULATING</subject><subject>COMPUTING</subject><subject>COUNTING</subject><subject>ELECTRIC DIGITAL DATA PROCESSING</subject><subject>PHYSICS</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2005</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNijsOwjAQBd1QIOAOewEkxFdpQSBqIHW0cl6ileK1Za_vTwoOQDNTzCxd-0JfvehIJgFkkQK41AzyUYtlFjVKnDnAkAvFYQ4hRYVaIVFinWkYMxt68pJ9FVu7xcBTwebnlaPH_XN7bpFih5LYQ2Fd-z43u-Pp0lz3hz-WL6yOOYc</recordid><startdate>20050607</startdate><enddate>20050607</enddate><creator>BHOWMIK SURAVI</creator><creator>KATLA SREEKANTHA MADHAVA</creator><creator>PRASAD VIKAS K</creator><creator>SHAH KALPESH AMRUTHLAL</creator><scope>EVB</scope></search><sort><creationdate>20050607</creationdate><title>Reducing time to measure constraint parameters of components in an integrated circuit</title><author>BHOWMIK SURAVI ; KATLA SREEKANTHA MADHAVA ; PRASAD VIKAS K ; SHAH KALPESH AMRUTHLAL</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US6904579B23</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2005</creationdate><topic>CALCULATING</topic><topic>COMPUTING</topic><topic>COUNTING</topic><topic>ELECTRIC DIGITAL DATA PROCESSING</topic><topic>PHYSICS</topic><toplevel>online_resources</toplevel><creatorcontrib>BHOWMIK SURAVI</creatorcontrib><creatorcontrib>KATLA SREEKANTHA MADHAVA</creatorcontrib><creatorcontrib>PRASAD VIKAS K</creatorcontrib><creatorcontrib>SHAH KALPESH AMRUTHLAL</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>BHOWMIK SURAVI</au><au>KATLA SREEKANTHA MADHAVA</au><au>PRASAD VIKAS K</au><au>SHAH KALPESH AMRUTHLAL</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Reducing time to measure constraint parameters of components in an integrated circuit</title><date>2005-06-07</date><risdate>2005</risdate><abstract>Reducing the time required to measure constraint parameters (setup time, hold time and pulse width) of components in integrated circuits. For example, the delay of propagation of a signal between an input node and an intermediate node of a component are measured. An approximate range of possible values is formulated, and a search (by applying signals assuming one of the values in the approximate range and examining the output signal(s)) is conducted within the range to determine the value of the constraint parameters.</abstract><edition>7</edition><oa>free_for_read</oa></addata></record>
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subjects	CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING PHYSICS
title	Reducing time to measure constraint parameters of components in an integrated circuit
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