Reducing time to measure constraint parameters of components in an integrated circuit

Reducing the time required to measure constraint parameters (setup time, hold time and pulse width) of components in integrated circuits. For example, the delay of propagation of a signal between an input node and an intermediate node of a component are measured. An approximate range of possible values is formulated, and a search (by applying signals assuming one of the values in the approximate range and examining the output signal(s)) is conducted within the range to determine the value of the constraint parameters.