Method for accurate output voltage testing
A method for accurate testing of the output voltage of an integrated circuit comprises enabling a differential voltage comparator on the integrated circuit to be tested. One input to the differential comparator is set to a reference voltage, and the other input is coupled to a node to be tested. A c...
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| Format: | Patent |
| Sprache: | eng |
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| Zusammenfassung: | A method for accurate testing of the output voltage of an integrated circuit comprises enabling a differential voltage comparator on the integrated circuit to be tested. One input to the differential comparator is set to a reference voltage, and the other input is coupled to a node to be tested. A current load is injected at the node, and the output of the voltage comparator can be used to determine if the integrated circuit performs within the specifications set by a manufacturer. |
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