CPU-based system and method for testing embedded memory

A CPU-based system 10 and method for testing embedded memory. The technique employs the on-chip CPU 20 itself to test the embedded memory 24. An assembly code program is loaded into the device under test (DUT) 12 to test the memories, determine a repair solution, and write out the repair solution an...

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Bibliographische Detailangaben
Hauptverfasser:	CHEN BIBO, JARBOE, JR. JAMES M, SCHUTT NICHOLAS H
Format:	Patent
Sprache:	eng
Schlagworte:	CALCULATING COMPUTING COUNTING ELECTRIC COMMUNICATION TECHNIQUE ELECTRIC DIGITAL DATA PROCESSING ELECTRICITY INFORMATION STORAGE PHYSICS STATIC STORES TRANSMISSION
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Beschreibung
Zusammenfassung:	A CPU-based system 10 and method for testing embedded memory. The technique employs the on-chip CPU 20 itself to test the embedded memory 24. An assembly code program is loaded into the device under test (DUT) 12 to test the memories, determine a repair solution, and write out the repair solution and raw failure information to the tester for defect analysis. The test is driven by an external programmable clock that is provided by the tester to allow the DUT 12 to run up to its maximum input clock rate in order to maximize throughput. The test is not dependent on the pattern rate of the tester.