Measurement of components that have been micro-galvanically produced, using a sample component by means of photoresist webs

A method for measuring microgalvanically produced components having a three-dimensional, depth-lithographically produced structure, which provides a single- or multilayer component which is constructed using galvanic metal deposition, the metal being deposited around a structure of photoresist defin...

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description A method for measuring microgalvanically produced components having a three-dimensional, depth-lithographically produced structure, which provides a single- or multilayer component which is constructed using galvanic metal deposition, the metal being deposited around a structure of photoresist defining the desired orifice contour of the component; in the process, a photoresist region, which selectively interrupts the structure of the component to be manufactured, being incorporated during the microgalvanic production; at least the interrupting photoresist region being dissolved out of the interrupted component; and a contactless measuring of the orifice structure of the interrupted component being undertaken in the region of a previously existing resist edge of the photoresist region using a measuring device.
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fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US6854347B2</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US6854347B2</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US6854347B23</originalsourceid><addsrcrecordid>eNqNjLsKwkAUBdNYiPoP9wNMY-KjVhQbK7UON5uTB-yLvZtI8OdVEGythoFhpsnzApY-wMBGcjUpZ7yzbxGKLUdqeQCVgCXTqeDShvXAtlOs9Ug-uKpXqJbUS2cbYhI2XuN3oXIkA7byefvWRRcgnUR6oJR5MqlZCxZfzhI6HW-HcwrvCohnBYtY3K-b3TrP8u1-lf2RvABdmUej</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Measurement of components that have been micro-galvanically produced, using a sample component by means of photoresist webs</title><source>esp@cenet</source><creator>DANTES GUENTER</creator><creatorcontrib>DANTES GUENTER</creatorcontrib><description>A method for measuring microgalvanically produced components having a three-dimensional, depth-lithographically produced structure, which provides a single- or multilayer component which is constructed using galvanic metal deposition, the metal being deposited around a structure of photoresist defining the desired orifice contour of the component; in the process, a photoresist region, which selectively interrupts the structure of the component to be manufactured, being incorporated during the microgalvanic production; at least the interrupting photoresist region being dissolved out of the interrupted component; and a contactless measuring of the orifice structure of the interrupted component being undertaken in the region of a previously existing resist edge of the photoresist region using a measuring device.</description><edition>7</edition><language>eng</language><subject>APPARATUS SPECIALLY ADAPTED THEREFOR ; APPARATUS THEREFOR ; APPLYING LIQUIDS OR OTHER FLUENT MATERIALS TO SURFACES, IN GENERAL ; ATOMISING APPARATUS ; BLASTING ; CHEMISTRY ; CINEMATOGRAPHY ; COMBUSTION ENGINES ; ELECTROFORMING ; ELECTROGRAPHY ; ELECTROLYTIC OR ELECTROPHORETIC PROCESSES ; HEATING ; HOLOGRAPHY ; HOT-GAS OR COMBUSTION-PRODUCT ENGINE PLANTS ; LIGHTING ; MATERIALS THEREFOR ; MEASURING ; MEASURING ANGLES ; MEASURING AREAS ; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS ; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS ; MECHANICAL ENGINEERING ; METALLURGY ; NOZZLES ; ORIGINALS THEREFOR ; PERFORMING OPERATIONS ; PHOTOGRAPHY ; PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES,e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTORDEVICES ; PHYSICS ; PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTIONOF COATINGS ; SPRAYING APPARATUS ; SPRAYING OR ATOMISING IN GENERAL ; SUPPLYING COMBUSTION ENGINES IN GENERAL, WITH COMBUSTIBLEMIXTURES OR CONSTITUENTS THEREOF ; TESTING ; TRANSPORTING ; WEAPONS</subject><creationdate>2005</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20050215&amp;DB=EPODOC&amp;CC=US&amp;NR=6854347B2$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,777,882,25545,76296</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20050215&amp;DB=EPODOC&amp;CC=US&amp;NR=6854347B2$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>DANTES GUENTER</creatorcontrib><title>Measurement of components that have been micro-galvanically produced, using a sample component by means of photoresist webs</title><description>A method for measuring microgalvanically produced components having a three-dimensional, depth-lithographically produced structure, which provides a single- or multilayer component which is constructed using galvanic metal deposition, the metal being deposited around a structure of photoresist defining the desired orifice contour of the component; in the process, a photoresist region, which selectively interrupts the structure of the component to be manufactured, being incorporated during the microgalvanic production; at least the interrupting photoresist region being dissolved out of the interrupted component; and a contactless measuring of the orifice structure of the interrupted component being undertaken in the region of a previously existing resist edge of the photoresist region using a measuring device.</description><subject>APPARATUS SPECIALLY ADAPTED THEREFOR</subject><subject>APPARATUS THEREFOR</subject><subject>APPLYING LIQUIDS OR OTHER FLUENT MATERIALS TO SURFACES, IN GENERAL</subject><subject>ATOMISING APPARATUS</subject><subject>BLASTING</subject><subject>CHEMISTRY</subject><subject>CINEMATOGRAPHY</subject><subject>COMBUSTION ENGINES</subject><subject>ELECTROFORMING</subject><subject>ELECTROGRAPHY</subject><subject>ELECTROLYTIC OR ELECTROPHORETIC PROCESSES</subject><subject>HEATING</subject><subject>HOLOGRAPHY</subject><subject>HOT-GAS OR COMBUSTION-PRODUCT ENGINE PLANTS</subject><subject>LIGHTING</subject><subject>MATERIALS THEREFOR</subject><subject>MEASURING</subject><subject>MEASURING ANGLES</subject><subject>MEASURING AREAS</subject><subject>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</subject><subject>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</subject><subject>MECHANICAL ENGINEERING</subject><subject>METALLURGY</subject><subject>NOZZLES</subject><subject>ORIGINALS THEREFOR</subject><subject>PERFORMING OPERATIONS</subject><subject>PHOTOGRAPHY</subject><subject>PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES,e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTORDEVICES</subject><subject>PHYSICS</subject><subject>PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTIONOF COATINGS</subject><subject>SPRAYING APPARATUS</subject><subject>SPRAYING OR ATOMISING IN GENERAL</subject><subject>SUPPLYING COMBUSTION ENGINES IN GENERAL, WITH COMBUSTIBLEMIXTURES OR CONSTITUENTS THEREOF</subject><subject>TESTING</subject><subject>TRANSPORTING</subject><subject>WEAPONS</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2005</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNjLsKwkAUBdNYiPoP9wNMY-KjVhQbK7UON5uTB-yLvZtI8OdVEGythoFhpsnzApY-wMBGcjUpZ7yzbxGKLUdqeQCVgCXTqeDShvXAtlOs9Ug-uKpXqJbUS2cbYhI2XuN3oXIkA7byefvWRRcgnUR6oJR5MqlZCxZfzhI6HW-HcwrvCohnBYtY3K-b3TrP8u1-lf2RvABdmUej</recordid><startdate>20050215</startdate><enddate>20050215</enddate><creator>DANTES GUENTER</creator><scope>EVB</scope></search><sort><creationdate>20050215</creationdate><title>Measurement of components that have been micro-galvanically produced, using a sample component by means of photoresist webs</title><author>DANTES GUENTER</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US6854347B23</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2005</creationdate><topic>APPARATUS SPECIALLY ADAPTED THEREFOR</topic><topic>APPARATUS THEREFOR</topic><topic>APPLYING LIQUIDS OR OTHER FLUENT MATERIALS TO SURFACES, IN GENERAL</topic><topic>ATOMISING APPARATUS</topic><topic>BLASTING</topic><topic>CHEMISTRY</topic><topic>CINEMATOGRAPHY</topic><topic>COMBUSTION ENGINES</topic><topic>ELECTROFORMING</topic><topic>ELECTROGRAPHY</topic><topic>ELECTROLYTIC OR ELECTROPHORETIC PROCESSES</topic><topic>HEATING</topic><topic>HOLOGRAPHY</topic><topic>HOT-GAS OR COMBUSTION-PRODUCT ENGINE PLANTS</topic><topic>LIGHTING</topic><topic>MATERIALS THEREFOR</topic><topic>MEASURING</topic><topic>MEASURING ANGLES</topic><topic>MEASURING AREAS</topic><topic>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</topic><topic>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</topic><topic>MECHANICAL ENGINEERING</topic><topic>METALLURGY</topic><topic>NOZZLES</topic><topic>ORIGINALS THEREFOR</topic><topic>PERFORMING OPERATIONS</topic><topic>PHOTOGRAPHY</topic><topic>PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES,e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTORDEVICES</topic><topic>PHYSICS</topic><topic>PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTIONOF COATINGS</topic><topic>SPRAYING APPARATUS</topic><topic>SPRAYING OR ATOMISING IN GENERAL</topic><topic>SUPPLYING COMBUSTION ENGINES IN GENERAL, WITH COMBUSTIBLEMIXTURES OR CONSTITUENTS THEREOF</topic><topic>TESTING</topic><topic>TRANSPORTING</topic><topic>WEAPONS</topic><toplevel>online_resources</toplevel><creatorcontrib>DANTES GUENTER</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>DANTES GUENTER</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Measurement of components that have been micro-galvanically produced, using a sample component by means of photoresist webs</title><date>2005-02-15</date><risdate>2005</risdate><abstract>A method for measuring microgalvanically produced components having a three-dimensional, depth-lithographically produced structure, which provides a single- or multilayer component which is constructed using galvanic metal deposition, the metal being deposited around a structure of photoresist defining the desired orifice contour of the component; in the process, a photoresist region, which selectively interrupts the structure of the component to be manufactured, being incorporated during the microgalvanic production; at least the interrupting photoresist region being dissolved out of the interrupted component; and a contactless measuring of the orifice structure of the interrupted component being undertaken in the region of a previously existing resist edge of the photoresist region using a measuring device.</abstract><edition>7</edition><oa>free_for_read</oa></addata></record>
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subjects APPARATUS SPECIALLY ADAPTED THEREFOR
APPARATUS THEREFOR
APPLYING LIQUIDS OR OTHER FLUENT MATERIALS TO SURFACES, IN GENERAL
ATOMISING APPARATUS
BLASTING
CHEMISTRY
CINEMATOGRAPHY
COMBUSTION ENGINES
ELECTROFORMING
ELECTROGRAPHY
ELECTROLYTIC OR ELECTROPHORETIC PROCESSES
HEATING
HOLOGRAPHY
HOT-GAS OR COMBUSTION-PRODUCT ENGINE PLANTS
LIGHTING
MATERIALS THEREFOR
MEASURING
MEASURING ANGLES
MEASURING AREAS
MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS
MECHANICAL ENGINEERING
METALLURGY
NOZZLES
ORIGINALS THEREFOR
PERFORMING OPERATIONS
PHOTOGRAPHY
PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES,e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTORDEVICES
PHYSICS
PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTIONOF COATINGS
SPRAYING APPARATUS
SPRAYING OR ATOMISING IN GENERAL
SUPPLYING COMBUSTION ENGINES IN GENERAL, WITH COMBUSTIBLEMIXTURES OR CONSTITUENTS THEREOF
TESTING
TRANSPORTING
WEAPONS
title Measurement of components that have been micro-galvanically produced, using a sample component by means of photoresist webs
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-19T18%3A19%3A31IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=DANTES%20GUENTER&rft.date=2005-02-15&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EUS6854347B2%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true