Temperature measurement of an electronic device

The temperature of an electronic device at specified locations is determined by measuring the phonon frequency shift at the location of interest caused by operation of the device.

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Hauptverfasser: KUBALL MARTIN HERMANN HANS, HAYES JONATHAN MICHAEL
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creator KUBALL MARTIN HERMANN HANS
HAYES JONATHAN MICHAEL
description The temperature of an electronic device at specified locations is determined by measuring the phonon frequency shift at the location of interest caused by operation of the device.
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fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US6786637B2</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US6786637B2</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US6786637B23</originalsourceid><addsrcrecordid>eNrjZNAPSc0tSC1KLCktSlXITU0sBtK5qXklCvlpCol5Cqk5qcklRfl5mckKKallmcmpPAysaYk5xam8UJqbQcHNNcTZQze1ID8-tbggMTk1L7UkPjTYzNzCzMzY3MnImAglAAMSKw4</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Temperature measurement of an electronic device</title><source>esp@cenet</source><creator>KUBALL MARTIN HERMANN HANS ; HAYES JONATHAN MICHAEL</creator><creatorcontrib>KUBALL MARTIN HERMANN HANS ; HAYES JONATHAN MICHAEL</creatorcontrib><description>The temperature of an electronic device at specified locations is determined by measuring the phonon frequency shift at the location of interest caused by operation of the device.</description><edition>7</edition><language>eng</language><subject>COLORIMETRY ; MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT ; MEASURING ; PHYSICS ; RADIATION PYROMETRY ; TESTING</subject><creationdate>2004</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20040907&amp;DB=EPODOC&amp;CC=US&amp;NR=6786637B2$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25555,76308</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20040907&amp;DB=EPODOC&amp;CC=US&amp;NR=6786637B2$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>KUBALL MARTIN HERMANN HANS</creatorcontrib><creatorcontrib>HAYES JONATHAN MICHAEL</creatorcontrib><title>Temperature measurement of an electronic device</title><description>The temperature of an electronic device at specified locations is determined by measuring the phonon frequency shift at the location of interest caused by operation of the device.</description><subject>COLORIMETRY</subject><subject>MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>RADIATION PYROMETRY</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2004</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZNAPSc0tSC1KLCktSlXITU0sBtK5qXklCvlpCol5Cqk5qcklRfl5mckKKallmcmpPAysaYk5xam8UJqbQcHNNcTZQze1ID8-tbggMTk1L7UkPjTYzNzCzMzY3MnImAglAAMSKw4</recordid><startdate>20040907</startdate><enddate>20040907</enddate><creator>KUBALL MARTIN HERMANN HANS</creator><creator>HAYES JONATHAN MICHAEL</creator><scope>EVB</scope></search><sort><creationdate>20040907</creationdate><title>Temperature measurement of an electronic device</title><author>KUBALL MARTIN HERMANN HANS ; HAYES JONATHAN MICHAEL</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US6786637B23</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2004</creationdate><topic>COLORIMETRY</topic><topic>MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT</topic><topic>MEASURING</topic><topic>PHYSICS</topic><topic>RADIATION PYROMETRY</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>KUBALL MARTIN HERMANN HANS</creatorcontrib><creatorcontrib>HAYES JONATHAN MICHAEL</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>KUBALL MARTIN HERMANN HANS</au><au>HAYES JONATHAN MICHAEL</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Temperature measurement of an electronic device</title><date>2004-09-07</date><risdate>2004</risdate><abstract>The temperature of an electronic device at specified locations is determined by measuring the phonon frequency shift at the location of interest caused by operation of the device.</abstract><edition>7</edition><oa>free_for_read</oa></addata></record>
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source esp@cenet
subjects COLORIMETRY
MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT
MEASURING
PHYSICS
RADIATION PYROMETRY
TESTING
title Temperature measurement of an electronic device
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-15T01%3A14%3A03IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=KUBALL%20MARTIN%20HERMANN%20HANS&rft.date=2004-09-07&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EUS6786637B2%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true