Temperature measurement of an electronic device

Temperature measurement of an electronic device

The temperature of an electronic device at specified locations is determined by measuring the phonon frequency shift at the location of interest caused by operation of the device.

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: KUBALL MARTIN HERMANN HANS, HAYES JONATHAN MICHAEL
Format: Patent
Sprache:eng
Schlagworte:
COLORIMETRY
MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT
MEASURING
PHYSICS
RADIATION PYROMETRY
TESTING
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Beschreibung
Zusammenfassung:The temperature of an electronic device at specified locations is determined by measuring the phonon frequency shift at the location of interest caused by operation of the device.