Using clock gating or signal gating to partition a device for fault isolation and diagnostic data collection

Using clock gating or signal gating to partition a device for fault isolation and diagnostic data collection

In one aspect, an electronic device that has been partitioned into segments by using clock gating or signal gating is tested. One of the segments that is a source of a failure is identified. Diagnostic procedures are applied to the identified segment to determine a cause of the failure.

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Bibliographische Detailangaben
Hauptverfasser: HUISMAN LEENDERT M, HUOTT WILLIAM V, MOTIKA FRANCO, PASTEL LEAH M. PFEIFER
Format: Patent
Sprache:eng
Schlagworte:
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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Beschreibung
Zusammenfassung:In one aspect, an electronic device that has been partitioned into segments by using clock gating or signal gating is tested. One of the segments that is a source of a failure is identified. Diagnostic procedures are applied to the identified segment to determine a cause of the failure.