Method for fabricating semiconductor device

A peeling film is deposited on an insulating film, which is formed on a semiconductor substrate and has a hole, and on the bottom and the wall of the hole so as not to fill the hole with the peeling film. A resist film is formed over the peeling film so as to fill the hole. A resist pattern is forme...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
1. Verfasser: KANEGAE KENSHI
Format: Patent
Sprache:eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:A peeling film is deposited on an insulating film, which is formed on a semiconductor substrate and has a hole, and on the bottom and the wall of the hole so as not to fill the hole with the peeling film. A resist film is formed over the peeling film so as to fill the hole. A resist pattern is formed by patterning the resist film so as to form an interconnect groove opening around the hole and to allow a portion of the resist film to remain within the hole. The peeling film and the insulating film are etched by using the resist pattern as a mask, so as to form an interconnect groove continuous with the hole in the insulating film. After removing the resist pattern, a remaining portion of the peeling film is removed.