Approach to optimizing an ILD argon sputter process

A sputter etch system and a method of conducting a sputter etch. The sputter etch system includes an etch chamber with a wafer pedestal having a top surface to support a wafer and a magnet configured to provide a continuous magnetic field directed at the top surface of the wafer pedestal.

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Bibliographische Detailangaben
Hauptverfasser: MAXIM MIKE, SCHATZ KEN, HUFF BRETT E, PETRO WILLIAM G
Format: Patent
Sprache:eng
Schlagworte:
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Beschreibung
Zusammenfassung:A sputter etch system and a method of conducting a sputter etch. The sputter etch system includes an etch chamber with a wafer pedestal having a top surface to support a wafer and a magnet configured to provide a continuous magnetic field directed at the top surface of the wafer pedestal.