Technique for imaging electrical contacts

A congruence between the element that provides an electrical conductive path in a component of micron dimensions and an imaging of that element provides a basis for predicting the effectiveness and the consistency in the functioning of the element in an actual operating environment. The element is f...

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Bibliographische Detailangaben
Hauptverfasser: BRODSKY WILLIAM L, LEHMAN LAWRENCE P, VAN HART DANIEL C
Format: Patent
Sprache:eng
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Zusammenfassung:A congruence between the element that provides an electrical conductive path in a component of micron dimensions and an imaging of that element provides a basis for predicting the effectiveness and the consistency in the functioning of the element in an actual operating environment. The element is formed first into a sandwich whereby the operating end is deformed against a light transparent surface. By directing a beam of light into the end of that light transparent surface, the asperity of the operating end produces a light scattering effect that is imaged by microscopic optics that is located facing the operating end.