Simultaneous formation of deep trench capacitor and resistor

A compact resistor is formed in an integrated circuit using many of the same steps as are employed in forming a trench capacitor for a DRAM cell; in particular depositing a layer of heavily doped germanium in the trench interior after the step of doping the substrate to form the bottom plate for the...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: MCSTAY IRENE L, CHAKRAVARTI SATYA N, WONG KWONG HON, CHAKRAVARTI ASHIMA B
Format: Patent
Sprache:eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:A compact resistor is formed in an integrated circuit using many of the same steps as are employed in forming a trench capacitor for a DRAM cell; in particular depositing a layer of heavily doped germanium in the trench interior after the step of doping the substrate to form the bottom plate for the capacitor, depositing polysilicon having the required resistivity in the trench then removing the germanium and leaving only enough to form an ohmic contact in the trench bottom.