Test simulation of a read/write head

Test simulation of a read/write head

A test simulation circuit includes a simulated read/write head with a magnet shield and a magnetoresistive sensor exposed at a lapped surface. The test simulation circuit also includes first and second electrical test path connected respectively to the magnet shield and the magnetoresistive sensor....

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: WEYANDT PETER T, RYAN PATRICK J, CHANG CLIFTON H, HEIM KEVIN R
Format: Patent
Sprache:eng
Schlagworte:
INFORMATION STORAGE
INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORDCARRIER AND TRANSDUCER
PHYSICS
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Beschreibung
Zusammenfassung:A test simulation circuit includes a simulated read/write head with a magnet shield and a magnetoresistive sensor exposed at a lapped surface. The test simulation circuit also includes first and second electrical test path connected respectively to the magnet shield and the magnetoresistive sensor. The second electrical test path is electrically isolated from the first electrical test path.