Method of forming dummy metal pattern

A method of forming a dummy metal pattern for manufacturing an interconnect pattern. The invention forms a dummy metal pattern on a wafer having a fixed layout while fabricating an interconnect so as to make uniform the metal line pattern on the wafer. Thus, a loading effect can be avoided to benefi...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: CHANG WEI-YEN, YEH TSUEII
Format: Patent
Sprache:eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:A method of forming a dummy metal pattern for manufacturing an interconnect pattern. The invention forms a dummy metal pattern on a wafer having a fixed layout while fabricating an interconnect so as to make uniform the metal line pattern on the wafer. Thus, a loading effect can be avoided to benefit a subsequent process, device reliability can be enhanced, and yield can also be increased.