Method for identifying and correcting pixels with excess pixel lag in a solid state x-ray detector

A method is provided to identify pixels in a digital x-ray detector that experience an amount of residual charge that is sufficient to cause an image artifact. A lag artifact threshold is obtained. The lag artifact threshold identifies an amount of residual charge that, when held by the pixels in th...

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Bibliographische Detailangaben
Hauptverfasser:	BOUDRY JOHN MOORE, KUMP KENNETH SCOTT, ODOGBA JIBRIL
Format:	Patent
Sprache:	eng
Schlagworte:	BASIC ELECTRIC ELEMENTS CALCULATING COMPUTING COUNTING DIAGNOSIS ELECTRIC COMMUNICATION TECHNIQUE ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY HUMAN NECESSITIES HYGIENE IDENTIFICATION IMAGE DATA PROCESSING OR GENERATION, IN GENERAL MEASUREMENT OF NUCLEAR OR X-RADIATION MEASURING MEDICAL OR VETERINARY SCIENCE PHYSICS PICTORIAL COMMUNICATION, e.g. TELEVISION SEMICONDUCTOR DEVICES SURGERY TESTING
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Beschreibung
Zusammenfassung:	A method is provided to identify pixels in a digital x-ray detector that experience an amount of residual charge that is sufficient to cause an image artifact. A lag artifact threshold is obtained. The lag artifact threshold identifies an amount of residual charge that, when held by the pixels in the digital x-ray detector, will cause image artifacts. A pixel lag experienced by a pixel is determined. The pixel lag may be different for each pixel. Pixels that have a pixel lag exceeding the lag artifact threshold are identified and corrected.