Method for quality function deployment

Method for quality function deployment

An exemplary embodiment of the invention is directed to a method for performing quality function deployment for a system having a plurality of levels. The method includes obtaining a plurality of first level critical to quality parameters and obtaining a plurality of first level key control paramete...

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Hauptverfasser: MARTIN ARLIE RUSSELL, PAPALLO, JR. THOMAS FREDERICK, SNYDER DOUGLAS J, PRESTON MARK ALAN, LOUNSBERRY BRIAN DOUGLAS, IDELCHIK MICHAEL SOLOMON, BAGEPALLI BHARAT SAMPATHKUMARAN, KHAN KHAN MOHAMED KHIRULLAH GENGHIS, ALI MOHAMED AHMED, GADRE ANIRUDDHA DATTATRAYA, SEYMOUR RAYMOND KELSEY, DORRI BIJAN, EBBEN THOMAS GERARD
Format: Patent
Sprache:eng
Schlagworte:
CALCULATING
COMPUTING
COUNTING
DATA PROCESSING SYSTEMS OR METHODS, SPECIALLY ADAPTED FORADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORYOR FORECASTING PURPOSES
PHYSICS
SYSTEMS OR METHODS SPECIALLY ADAPTED FOR ADMINISTRATIVE,COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORY OR FORECASTINGPURPOSES, NOT OTHERWISE PROVIDED FOR
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Beschreibung
Zusammenfassung:An exemplary embodiment of the invention is directed to a method for performing quality function deployment for a system having a plurality of levels. The method includes obtaining a plurality of first level critical to quality parameters and obtaining a plurality of first level key control parameters. A first level quality matrix is generated identifying an effect at least one first level key control parameter has on at least one first level critical to quality parameter. The first level key control parameters are arranged into a first group and a second group. A second level quality matrix is generated for the first group. The second level quality matrix includes second level critical to quality parameters corresponding to the first group of first level key control parameters and a second level key control parameter. The second level quality matrix identifies an effect said second level key control parameter has on at least one second level critical to quality parameter.