Sidewalls for guiding the via etch
A structure and method to direct the via 270 etch to the top of the interconnect 210, by using a sidewall layer 240, preferably. TiN, and thus preventing the etching down the side of the interconnect 210 and exposure of materials residing between the interconnects 210.
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Format: | Patent |
Sprache: | eng |
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Zusammenfassung: | A structure and method to direct the via 270 etch to the top of the interconnect 210, by using a sidewall layer 240, preferably. TiN, and thus preventing the etching down the side of the interconnect 210 and exposure of materials residing between the interconnects 210. |
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