Plug forming method for semiconductor device

A plug forming method for a semiconductor device includes the steps of forming an insulation layer in a semiconductor substrate, forming an opening on a predetermined surface portion of the semiconductor substrate, forming a polysilicon layer on the insulation layer including the opening, and etchin...

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Bibliographische Detailangaben
Hauptverfasser: HA JAE-HEE, CHI SUNG-HUN
Format: Patent
Sprache:eng
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Beschreibung
Zusammenfassung:A plug forming method for a semiconductor device includes the steps of forming an insulation layer in a semiconductor substrate, forming an opening on a predetermined surface portion of the semiconductor substrate, forming a polysilicon layer on the insulation layer including the opening, and etching back the polysilicon layer using a compound gas mixed by a first gas including fluorine, and a second gas including one selected from nitrogen and oxygen. The method decreases the etching loading effect and the plug loss, thereby improving the reliability of the semiconductor device.