Method for testing integrated circuit components of a multi-component card

An apparatus/method is provided for temporarily electrically contacting leads of an integrated circuit component on a multi-component board under test. A flexible circuit member having a plurality of contacts is used to connect to respective leads of the circuit component. A clamp mechanism imparts a clamping force to the flexible circuit member to clamp the flexible circuit member against the leads of the integrated circuit component, thereby ensuring that the plurality of contacts are in electrical contact with their respective leads. A resilient member is disposed between the flexible circuit member and the clamp mechanism for distributing and partially absorbing the clamping force imparted by the clamp mechanism in order to account for imperfections in and tolerances of the surface mount leads of the integrated circuit component. The plurality of contacts include dendritic surfaces to enhance electrical connection thereof to the respective leads of the integrated circuit component.