Method and device for obtaining a desired phase of optical characteristic of a fabry-perot etalon

A method and device for obtaining a desired phase of optical characteristic of a Fabry-Perot (FP) etalon using multiple optical detectors which, while passively aligned at various positions relative to an incident light beam, detect different phases of light signal emerging from the FP etalon. An FP...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	KOCH THOMAS L, ACKERMAN DAVID A
Format:	Patent
Sprache:	eng
Schlagworte:	BASIC ELECTRIC ELEMENTS COLORIMETRY DEVICES USING STIMULATED EMISSION ELECTRICITY MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT MEASURING OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS OPTICS PHYSICS RADIATION PYROMETRY TESTING
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