Method and device for obtaining a desired phase of optical characteristic of a fabry-perot etalon

A method and device for obtaining a desired phase of optical characteristic of a Fabry-Perot (FP) etalon using multiple optical detectors which, while passively aligned at various positions relative to an incident light beam, detect different phases of light signal emerging from the FP etalon. An FP...

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Bibliographische Detailangaben
Hauptverfasser:	KOCH THOMAS L, ACKERMAN DAVID A
Format:	Patent
Sprache:	eng
Schlagworte:	BASIC ELECTRIC ELEMENTS COLORIMETRY DEVICES USING STIMULATED EMISSION ELECTRICITY MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT MEASURING OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS OPTICS PHYSICS RADIATION PYROMETRY TESTING
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Beschreibung
Zusammenfassung:	A method and device for obtaining a desired phase of optical characteristic of a Fabry-Perot (FP) etalon using multiple optical detectors which, while passively aligned at various positions relative to an incident light beam, detect different phases of light signal emerging from the FP etalon. An FP etalon and optical detector array constructed in accordance with the present invention may be used as a frequency discriminator in an optical system where the FP etalon optical characteristic is required to have a particular phase.