Pasting layer formation method for high density plasma deposition chambers

The present invention provides a method of reducing particles within a deposition chamber without affecting bias voltage repeatability in subsequently processed wafers. Particularly, it has been discovered that within a high density plasma deposition chamber, the first wafer processed following depo...

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Bibliographische Detailangaben
1. Verfasser: NGAN KENNY KING-TAI
Format: Patent
Sprache:eng
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