Microwave testing high-power dummy load forming method and microwave testing high-power dummy load apparatus

In a method for forming microwave testing high-power dummy load, a first center conductor, to which microwave power is input, is connected to a power distributor formed from a second center conductor having an output-side distal end branching into a plurality of portions. This causes the microwave power input to the first center conductor to separate into a plurality of outputs in correspondence with the output-side distal end of the second center conductor. A plurality of termination resistors are connected between the output-side distal end of the second center conductor and a ground conductor to make the termination resistors consume the microwave power. The heat generated by the termination resistors upon consumption of the microwave power is radiated by the ground conductor. A microwave testing high-power dummy load apparatus made by the above described method is also disclosed.