Gapfill of semiconductor structure using doped silicate glasses

Improved gap fill of narrow spaces is achieved by using a doped silicate glass having a dopant concentration in a bottom portion thereof which is greater than an amount which causes surface crystal growth and in an upper portion thereof having a lower dopant concentration such that the overall dopan...

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Bibliographische Detailangaben
Hauptverfasser: KIRCHHOFF, MARKUS M, ILG, MATTHIAS
Format: Patent
Sprache:eng
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Zusammenfassung:Improved gap fill of narrow spaces is achieved by using a doped silicate glass having a dopant concentration in a bottom portion thereof which is greater than an amount which causes surface crystal growth and in an upper portion thereof having a lower dopant concentration such that the overall dopant concentration of the doped silicate glass is below that which causes surface crystal growth.