Devices and methods for testing tack uniformity of a coating on a substrate
Devices and methods are provided to characterize local, small-scale variations in tack build-up, e.g., by measuring tack over areas smaller than 20 mm2, preferably over areas smaller than 1 mm2. These devices and methods measure the tack properties, e.g., tack build-up, of a coating over a very smal...
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| creator | OSGOOD ALONZO K COLEMAN PHILLIP S HASSLER JOHN C BOUSFIELD DOUGLAS W |
| description | Devices and methods are provided to characterize local, small-scale variations in tack build-up, e.g., by measuring tack over areas smaller than 20 mm2, preferably over areas smaller than 1 mm2. These devices and methods measure the tack properties, e.g., tack build-up, of a coating over a very small area, allowing characterization of such small-scale variations. The invention also provides methods for using such characterization to predict back trap mottle (BTM). |
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| subjects | INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING |
| title | Devices and methods for testing tack uniformity of a coating on a substrate |
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