Devices and methods for testing tack uniformity of a coating on a substrate

Devices and methods for testing tack uniformity of a coating on a substrate

Devices and methods are provided to characterize local, small-scale variations in tack build-up, e.g., by measuring tack over areas smaller than 20 mm2, preferably over areas smaller than 1 mm2. These devices and methods measure the tack properties, e.g., tack build-up, of a coating over a very smal...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: OSGOOD, ALONZO K, COLEMAN, PHILLIP S, HASSLER, JOHN C, BOUSFIELD, DOUGLAS W
Format: Patent
Sprache:eng
Schlagworte:
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
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Beschreibung
Zusammenfassung:Devices and methods are provided to characterize local, small-scale variations in tack build-up, e.g., by measuring tack over areas smaller than 20 mm2, preferably over areas smaller than 1 mm2. These devices and methods measure the tack properties, e.g., tack build-up, of a coating over a very small area, allowing characterization of such small-scale variations. The invention also provides methods for using such characterization to predict back trap mottle (BTM).