Electrical lap guide data acquisition unit and measurement scheme

A lapping system data acquisition unit is disclosed for use in measuring resistances of multiple resistors embedded in a structure to be machined. Each of multiple independent current sources directs a current through one of the multiple resistors embedded in the structure during machining of a surf...

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Bibliographische Detailangaben
Hauptverfasser: AHLEN, LARS H, HEITKE, JOHN C, RIGLES, RAY V, WOOD, WILLIAM P, HAO, SHANLIN
Format: Patent
Sprache:eng
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Beschreibung
Zusammenfassung:A lapping system data acquisition unit is disclosed for use in measuring resistances of multiple resistors embedded in a structure to be machined. Each of multiple independent current sources directs a current through one of the multiple resistors embedded in the structure during machining of a surface of the structure. Each of multiple voltage sensing devices couples to a separate one of the multiple resistors and provides a separate analog voltage output signal indicative of the resistance of the resistor. Each of multiple filters is coupled to a separate one of the multiple voltage sensing devices Analog-to-digital conversion circuitry coupled to the multiple filters generates a digitized signal for each of the filtered output signals.