Apparatus for testing circuit boards
Apparatus for electrically testing a connector includes a plurality of contact posts (i.e., connector pins) partially surrounded by a sidewall defining an opening adjacent ends of the posts. In one embodiment a translator fixture is interfaced with a plurality of test probes. The translator fixture...
Gespeichert in:
| Hauptverfasser: | , , , , , , , , , , |
|---|---|
| Format: | Patent |
| Sprache: | eng |
| Schlagworte: | |
| Online-Zugang: | Volltext bestellen |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | |
|---|---|
| container_issue | |
| container_start_page | |
| container_title | |
| container_volume | |
| creator | DRISCOLL JOHN R KIELY JOHN R DELFOSSE DUANE A JEPSON BERT GALLAGHER ROBERT J CRONIN RAYMOND P |
| description | Apparatus for electrically testing a connector includes a plurality of contact posts (i.e., connector pins) partially surrounded by a sidewall defining an opening adjacent ends of the posts. In one embodiment a translator fixture is interfaced with a plurality of test probes. The translator fixture has a plurality of spaced apart translator plates and holes aligned in the plates for containing and supporting translator pins extending through the plates for positioning the translator pins for direct contact with and engagement by conductive pins of a guide block assembly mounted on the outermost one of the translator plates. The conductive pins are slidably mounted in the guide block assembly. The conductive pins extend from the guide block assembly so as to directly contact, be substantially coaxial with, and engage the distal ends of the contact posts. |
| format | Patent |
| fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US5945838A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US5945838A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US5945838A3</originalsourceid><addsrcrecordid>eNrjZFBxLChILEosKS1WSMsvUihJLS7JzEtXSM4sSi7NLFFIyk8sSinmYWBNS8wpTuWF0twM8m6uIc4euqkF-fGpxQWJyal5qSXxocGmliamFsYWjsaEVQAAk2cmbQ</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Apparatus for testing circuit boards</title><source>esp@cenet</source><creator>DRISCOLL; JOHN R ; KIELY; JOHN R ; DELFOSSE; DUANE A ; JEPSON; BERT ; GALLAGHER; ROBERT J ; CRONIN; RAYMOND P</creator><creatorcontrib>DRISCOLL; JOHN R ; KIELY; JOHN R ; DELFOSSE; DUANE A ; JEPSON; BERT ; GALLAGHER; ROBERT J ; CRONIN; RAYMOND P</creatorcontrib><description>Apparatus for electrically testing a connector includes a plurality of contact posts (i.e., connector pins) partially surrounded by a sidewall defining an opening adjacent ends of the posts. In one embodiment a translator fixture is interfaced with a plurality of test probes. The translator fixture has a plurality of spaced apart translator plates and holes aligned in the plates for containing and supporting translator pins extending through the plates for positioning the translator pins for direct contact with and engagement by conductive pins of a guide block assembly mounted on the outermost one of the translator plates. The conductive pins are slidably mounted in the guide block assembly. The conductive pins extend from the guide block assembly so as to directly contact, be substantially coaxial with, and engage the distal ends of the contact posts.</description><edition>6</edition><language>eng</language><subject>MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; TESTING</subject><creationdate>1999</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=19990831&DB=EPODOC&CC=US&NR=5945838A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76289</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=19990831&DB=EPODOC&CC=US&NR=5945838A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>DRISCOLL; JOHN R</creatorcontrib><creatorcontrib>KIELY; JOHN R</creatorcontrib><creatorcontrib>DELFOSSE; DUANE A</creatorcontrib><creatorcontrib>JEPSON; BERT</creatorcontrib><creatorcontrib>GALLAGHER; ROBERT J</creatorcontrib><creatorcontrib>CRONIN; RAYMOND P</creatorcontrib><title>Apparatus for testing circuit boards</title><description>Apparatus for electrically testing a connector includes a plurality of contact posts (i.e., connector pins) partially surrounded by a sidewall defining an opening adjacent ends of the posts. In one embodiment a translator fixture is interfaced with a plurality of test probes. The translator fixture has a plurality of spaced apart translator plates and holes aligned in the plates for containing and supporting translator pins extending through the plates for positioning the translator pins for direct contact with and engagement by conductive pins of a guide block assembly mounted on the outermost one of the translator plates. The conductive pins are slidably mounted in the guide block assembly. The conductive pins extend from the guide block assembly so as to directly contact, be substantially coaxial with, and engage the distal ends of the contact posts.</description><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>1999</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZFBxLChILEosKS1WSMsvUihJLS7JzEtXSM4sSi7NLFFIyk8sSinmYWBNS8wpTuWF0twM8m6uIc4euqkF-fGpxQWJyal5qSXxocGmliamFsYWjsaEVQAAk2cmbQ</recordid><startdate>19990831</startdate><enddate>19990831</enddate><creator>DRISCOLL; JOHN R</creator><creator>KIELY; JOHN R</creator><creator>DELFOSSE; DUANE A</creator><creator>JEPSON; BERT</creator><creator>GALLAGHER; ROBERT J</creator><creator>CRONIN; RAYMOND P</creator><scope>EVB</scope></search><sort><creationdate>19990831</creationdate><title>Apparatus for testing circuit boards</title><author>DRISCOLL; JOHN R ; KIELY; JOHN R ; DELFOSSE; DUANE A ; JEPSON; BERT ; GALLAGHER; ROBERT J ; CRONIN; RAYMOND P</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US5945838A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>1999</creationdate><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>DRISCOLL; JOHN R</creatorcontrib><creatorcontrib>KIELY; JOHN R</creatorcontrib><creatorcontrib>DELFOSSE; DUANE A</creatorcontrib><creatorcontrib>JEPSON; BERT</creatorcontrib><creatorcontrib>GALLAGHER; ROBERT J</creatorcontrib><creatorcontrib>CRONIN; RAYMOND P</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>DRISCOLL; JOHN R</au><au>KIELY; JOHN R</au><au>DELFOSSE; DUANE A</au><au>JEPSON; BERT</au><au>GALLAGHER; ROBERT J</au><au>CRONIN; RAYMOND P</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Apparatus for testing circuit boards</title><date>1999-08-31</date><risdate>1999</risdate><abstract>Apparatus for electrically testing a connector includes a plurality of contact posts (i.e., connector pins) partially surrounded by a sidewall defining an opening adjacent ends of the posts. In one embodiment a translator fixture is interfaced with a plurality of test probes. The translator fixture has a plurality of spaced apart translator plates and holes aligned in the plates for containing and supporting translator pins extending through the plates for positioning the translator pins for direct contact with and engagement by conductive pins of a guide block assembly mounted on the outermost one of the translator plates. The conductive pins are slidably mounted in the guide block assembly. The conductive pins extend from the guide block assembly so as to directly contact, be substantially coaxial with, and engage the distal ends of the contact posts.</abstract><edition>6</edition><oa>free_for_read</oa></addata></record> |
| fulltext | fulltext_linktorsrc |
| identifier | |
| ispartof | |
| issn | |
| language | eng |
| recordid | cdi_epo_espacenet_US5945838A |
| source | esp@cenet |
| subjects | MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING |
| title | Apparatus for testing circuit boards |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-09T18%3A27%3A36IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=DRISCOLL;%20JOHN%20R&rft.date=1999-08-31&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EUS5945838A%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |