Apparatus for testing circuit boards

Apparatus for electrically testing a connector includes a plurality of contact posts (i.e., connector pins) partially surrounded by a sidewall defining an opening adjacent ends of the posts. In one embodiment a translator fixture is interfaced with a plurality of test probes. The translator fixture has a plurality of spaced apart translator plates and holes aligned in the plates for containing and supporting translator pins extending through the plates for positioning the translator pins for direct contact with and engagement by conductive pins of a guide block assembly mounted on the outermost one of the translator plates. The conductive pins are slidably mounted in the guide block assembly. The conductive pins extend from the guide block assembly so as to directly contact, be substantially coaxial with, and engage the distal ends of the contact posts.