Apparatus for extracting pattern features

An apparatus is presented for extracting configurational features of an object formed by a number of surfaces with a two-dimensional laser pattern. Changes in the shape can be tracked, and speedy three-dimensional measurements are made possible in a small memory area without requiring parameter adjustment. The device comprises a two-dimensional laser pattern generating device which projects laser light in a desired two-dimensional pattern configuration, a three-dimensional position calculating device which synchronizes the timing of the laser light illumination with the timing of the detection of two-dimensional points. Three-dimensional coordinates of a surface point are rapidly calculated, then the surface parameters are determined by the three-dimensional positions of a number of points (three points or more). A pattern information generating device varies the pattern to be projected in accordance with the surface parameters so obtained, and a pattern recognition device controls the movements of a robot in accordance with variations in configuration based on the edge lines, vertexes and other features determined by a number of plane surfaces.