Test circuits and methods for integrated circuit having memory and non-memory circuits by accumulating bits of a particular logic state

An integrated circuit including a semiconductor chip and chip circuitry including memory circuitry and additional non-memory circuitry all fabricated on the semiconductor chip. The chip circuitry has a defined set of locations having logic states including a first logic state and at least one other...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: YIN, CHENWEI J
Format: Patent
Sprache:eng
Schlagworte:
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