Temperature and supply-voltage sensing circuit

A supply-voltage detecting stage (11) that supplies first and second reference currents (IREFP and IREFN) which vary with the supply voltage (Vcc) and are coupled by first and second gain stages (12A and 12B), respectively, to first and second temperature-detecting stages (13A and 13B), respectively...

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Bibliographische Detailangaben
Hauptverfasser:	LIN, SUNG-WEI, LIU, MING-BO, SYZDEK, RONALD J, COFFMAN, TIM M, TRUONG, PHAT C, COOTS, TIMOTHY J
Format:	Patent
Sprache:	eng
Schlagworte:	BASIC ELECTRONIC CIRCUITRY CONTROLLING ELECTRICITY MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES MEASURING QUANTITY OF HEAT MEASURING TEMPERATURE PHYSICS PULSE TECHNIQUE REGULATING SYSTEMS FOR REGULATING ELECTRIC OR MAGNETIC VARIABLES TESTING THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
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Beschreibung
Zusammenfassung:	A supply-voltage detecting stage (11) that supplies first and second reference currents (IREFP and IREFN) which vary with the supply voltage (Vcc) and are coupled by first and second gain stages (12A and 12B), respectively, to first and second temperature-detecting stages (13A and 13B), respectively. First and second temperature-detecting stages (13A and 13B) increase the coupled reference currents (IREFP and IREFN), respectively, to compensate for temperature increase through use temperature-sensitive, long-channel transistors (M34-M37 and M42-M45), supplying temperature and supply-voltage compensated output bias voltages at output terminals (MIRN and MIRP).