Apparatus and method for checking logic circuit

An apparatus and method for checking logic circuit checks logic element influenced by hot carriers in the logic circuit. The present invention comprises means for measuring rising transition time tr (or falling transition time tf) of signal generated by logic element comprising one portion of the lo...

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Bibliographische Detailangaben
Hauptverfasser:	YOKOTA, MIHO, URANO, MAHO
Format:	Patent
Sprache:	eng
Schlagworte:	BASIC ELECTRIC ELEMENTS BASIC ELECTRONIC CIRCUITRY CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS PULSE TECHNIQUE SEMICONDUCTOR DEVICES TESTING
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Beschreibung
Zusammenfassung:	An apparatus and method for checking logic circuit checks logic element influenced by hot carriers in the logic circuit. The present invention comprises means for measuring rising transition time tr (or falling transition time tf) of signal generated by logic element comprising one portion of the logic circuit; means for calculating a ratio (DUTY) of rising transition time tr (or falling transition time tf) and operation period T of the signal; and means for comparing said DUTY with maximum allowable duty (DUTYMAX), in order to detect the logic element having DUTY exceeding maximum allowable duty (DUTYMAX).