Array with redundant integrated self-testing scan drivers
An array includes redundant integrated scan drivers that can provide signals to each other through scan lines. Each scan driver can be a shift register, each stage of which includes a tri-state inverter to provide its output to one of the scan lines. To transfer signals from one shift register to th...
Gespeichert in:
| Hauptverfasser: | , , , |
|---|---|
| Format: | Patent |
| Sprache: | eng |
| Schlagworte: | |
| Online-Zugang: | Volltext bestellen |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | |
|---|---|
| container_issue | |
| container_start_page | |
| container_title | |
| container_volume | |
| creator | SIEMENS DUANE DACOSTA VICTOR M |
| description | An array includes redundant integrated scan drivers that can provide signals to each other through scan lines. Each scan driver can be a shift register, each stage of which includes a tri-state inverter to provide its output to one of the scan lines. To transfer signals from one shift register to the other, one shift register provides signals while the outputs of the other shift register are in a floating state. The other shift register receives the signals and can then shift them to its output. The signals can be test signals used to detect defects in the shift registers and in the array. Also, each stage in each shift register is connected to receive signals from the scan line that is driven by the preceding stage. Therefore, if the preceding stage is removed due to a defect, the following stage can receive signals through the scan line from the other shift register and continue to function even though its preceding stage is removed. |
| format | Patent |
| fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US5654970A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US5654970A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US5654970A3</originalsourceid><addsrcrecordid>eNrjZLB0LCpKrFQozyzJUChKTSnNS0nMK1HIzCtJTS9KLElNUShOzUnTLUktLsnMS1coTk7MU0gpyixLLSrmYWBNS8wpTuWF0twM8m6uIc4euqkF-fGpxQWJyal5qSXxocGmZqYmluYGjsaEVQAAt1Iucg</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Array with redundant integrated self-testing scan drivers</title><source>esp@cenet</source><creator>SIEMENS; DUANE ; DACOSTA; VICTOR M</creator><creatorcontrib>SIEMENS; DUANE ; DACOSTA; VICTOR M</creatorcontrib><description>An array includes redundant integrated scan drivers that can provide signals to each other through scan lines. Each scan driver can be a shift register, each stage of which includes a tri-state inverter to provide its output to one of the scan lines. To transfer signals from one shift register to the other, one shift register provides signals while the outputs of the other shift register are in a floating state. The other shift register receives the signals and can then shift them to its output. The signals can be test signals used to detect defects in the shift registers and in the array. Also, each stage in each shift register is connected to receive signals from the scan line that is driven by the preceding stage. Therefore, if the preceding stage is removed due to a defect, the following stage can receive signals through the scan line from the other shift register and continue to function even though its preceding stage is removed.</description><edition>6</edition><language>eng</language><subject>ADVERTISING ; ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICESUSING STATIC MEANS TO PRESENT VARIABLE INFORMATION ; CRYPTOGRAPHY ; DEVICES OR ARRANGEMENTS, THE OPTICAL OPERATION OF WHICH ISMODIFIED BY CHANGING THE OPTICAL PROPERTIES OF THE MEDIUM OF THEDEVICES OR ARRANGEMENTS FOR THE CONTROL OF THE INTENSITY,COLOUR, PHASE, POLARISATION OR DIRECTION OF LIGHT, e.g.SWITCHING, GATING, MODULATING OR DEMODULATING ; DISPLAY ; EDUCATION ; FREQUENCY-CHANGING ; MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; NON-LINEAR OPTICS ; OPTICAL ANALOGUE/DIGITAL CONVERTERS ; OPTICAL LOGIC ELEMENTS ; OPTICS ; PHYSICS ; SEALS ; TECHNIQUES OR PROCEDURES FOR THE OPERATION THEREOF ; TESTING</subject><creationdate>1997</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=19970805&DB=EPODOC&CC=US&NR=5654970A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25562,76317</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=19970805&DB=EPODOC&CC=US&NR=5654970A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>SIEMENS; DUANE</creatorcontrib><creatorcontrib>DACOSTA; VICTOR M</creatorcontrib><title>Array with redundant integrated self-testing scan drivers</title><description>An array includes redundant integrated scan drivers that can provide signals to each other through scan lines. Each scan driver can be a shift register, each stage of which includes a tri-state inverter to provide its output to one of the scan lines. To transfer signals from one shift register to the other, one shift register provides signals while the outputs of the other shift register are in a floating state. The other shift register receives the signals and can then shift them to its output. The signals can be test signals used to detect defects in the shift registers and in the array. Also, each stage in each shift register is connected to receive signals from the scan line that is driven by the preceding stage. Therefore, if the preceding stage is removed due to a defect, the following stage can receive signals through the scan line from the other shift register and continue to function even though its preceding stage is removed.</description><subject>ADVERTISING</subject><subject>ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICESUSING STATIC MEANS TO PRESENT VARIABLE INFORMATION</subject><subject>CRYPTOGRAPHY</subject><subject>DEVICES OR ARRANGEMENTS, THE OPTICAL OPERATION OF WHICH ISMODIFIED BY CHANGING THE OPTICAL PROPERTIES OF THE MEDIUM OF THEDEVICES OR ARRANGEMENTS FOR THE CONTROL OF THE INTENSITY,COLOUR, PHASE, POLARISATION OR DIRECTION OF LIGHT, e.g.SWITCHING, GATING, MODULATING OR DEMODULATING</subject><subject>DISPLAY</subject><subject>EDUCATION</subject><subject>FREQUENCY-CHANGING</subject><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>NON-LINEAR OPTICS</subject><subject>OPTICAL ANALOGUE/DIGITAL CONVERTERS</subject><subject>OPTICAL LOGIC ELEMENTS</subject><subject>OPTICS</subject><subject>PHYSICS</subject><subject>SEALS</subject><subject>TECHNIQUES OR PROCEDURES FOR THE OPERATION THEREOF</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>1997</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZLB0LCpKrFQozyzJUChKTSnNS0nMK1HIzCtJTS9KLElNUShOzUnTLUktLsnMS1coTk7MU0gpyixLLSrmYWBNS8wpTuWF0twM8m6uIc4euqkF-fGpxQWJyal5qSXxocGmZqYmluYGjsaEVQAAt1Iucg</recordid><startdate>19970805</startdate><enddate>19970805</enddate><creator>SIEMENS; DUANE</creator><creator>DACOSTA; VICTOR M</creator><scope>EVB</scope></search><sort><creationdate>19970805</creationdate><title>Array with redundant integrated self-testing scan drivers</title><author>SIEMENS; DUANE ; DACOSTA; VICTOR M</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US5654970A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>1997</creationdate><topic>ADVERTISING</topic><topic>ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICESUSING STATIC MEANS TO PRESENT VARIABLE INFORMATION</topic><topic>CRYPTOGRAPHY</topic><topic>DEVICES OR ARRANGEMENTS, THE OPTICAL OPERATION OF WHICH ISMODIFIED BY CHANGING THE OPTICAL PROPERTIES OF THE MEDIUM OF THEDEVICES OR ARRANGEMENTS FOR THE CONTROL OF THE INTENSITY,COLOUR, PHASE, POLARISATION OR DIRECTION OF LIGHT, e.g.SWITCHING, GATING, MODULATING OR DEMODULATING</topic><topic>DISPLAY</topic><topic>EDUCATION</topic><topic>FREQUENCY-CHANGING</topic><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>NON-LINEAR OPTICS</topic><topic>OPTICAL ANALOGUE/DIGITAL CONVERTERS</topic><topic>OPTICAL LOGIC ELEMENTS</topic><topic>OPTICS</topic><topic>PHYSICS</topic><topic>SEALS</topic><topic>TECHNIQUES OR PROCEDURES FOR THE OPERATION THEREOF</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>SIEMENS; DUANE</creatorcontrib><creatorcontrib>DACOSTA; VICTOR M</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>SIEMENS; DUANE</au><au>DACOSTA; VICTOR M</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Array with redundant integrated self-testing scan drivers</title><date>1997-08-05</date><risdate>1997</risdate><abstract>An array includes redundant integrated scan drivers that can provide signals to each other through scan lines. Each scan driver can be a shift register, each stage of which includes a tri-state inverter to provide its output to one of the scan lines. To transfer signals from one shift register to the other, one shift register provides signals while the outputs of the other shift register are in a floating state. The other shift register receives the signals and can then shift them to its output. The signals can be test signals used to detect defects in the shift registers and in the array. Also, each stage in each shift register is connected to receive signals from the scan line that is driven by the preceding stage. Therefore, if the preceding stage is removed due to a defect, the following stage can receive signals through the scan line from the other shift register and continue to function even though its preceding stage is removed.</abstract><edition>6</edition><oa>free_for_read</oa></addata></record> |
| fulltext | fulltext_linktorsrc |
| identifier | |
| ispartof | |
| issn | |
| language | eng |
| recordid | cdi_epo_espacenet_US5654970A |
| source | esp@cenet |
| subjects | ADVERTISING ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICESUSING STATIC MEANS TO PRESENT VARIABLE INFORMATION CRYPTOGRAPHY DEVICES OR ARRANGEMENTS, THE OPTICAL OPERATION OF WHICH ISMODIFIED BY CHANGING THE OPTICAL PROPERTIES OF THE MEDIUM OF THEDEVICES OR ARRANGEMENTS FOR THE CONTROL OF THE INTENSITY,COLOUR, PHASE, POLARISATION OR DIRECTION OF LIGHT, e.g.SWITCHING, GATING, MODULATING OR DEMODULATING DISPLAY EDUCATION FREQUENCY-CHANGING MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES NON-LINEAR OPTICS OPTICAL ANALOGUE/DIGITAL CONVERTERS OPTICAL LOGIC ELEMENTS OPTICS PHYSICS SEALS TECHNIQUES OR PROCEDURES FOR THE OPERATION THEREOF TESTING |
| title | Array with redundant integrated self-testing scan drivers |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-14T09%3A19%3A53IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=SIEMENS;%20DUANE&rft.date=1997-08-05&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EUS5654970A%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |