Array with redundant integrated self-testing scan drivers

An array includes redundant integrated scan drivers that can provide signals to each other through scan lines. Each scan driver can be a shift register, each stage of which includes a tri-state inverter to provide its output to one of the scan lines. To transfer signals from one shift register to th...

Ausführliche Beschreibung

Gespeichert in:

Bibliographische Detailangaben
Hauptverfasser:	SIEMENS, DUANE, DACOSTA, VICTOR M
Format:	Patent
Sprache:	eng
Schlagworte:	ADVERTISING ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICESUSING STATIC MEANS TO PRESENT VARIABLE INFORMATION CRYPTOGRAPHY DEVICES OR ARRANGEMENTS, THE OPTICAL OPERATION OF WHICH ISMODIFIED BY CHANGING THE OPTICAL PROPERTIES OF THE MEDIUM OF THEDEVICES OR ARRANGEMENTS FOR THE CONTROL OF THE INTENSITY,COLOUR, PHASE, POLARISATION OR DIRECTION OF LIGHT, e.g.SWITCHING, GATING, MODULATING OR DEMODULATING DISPLAY EDUCATION FREQUENCY-CHANGING MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES NON-LINEAR OPTICS OPTICAL ANALOGUE/DIGITAL CONVERTERS OPTICAL LOGIC ELEMENTS OPTICS PHYSICS SEALS TECHNIQUES OR PROCEDURES FOR THE OPERATION THEREOF TESTING
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!

Beschreibung
Zusammenfassung:	An array includes redundant integrated scan drivers that can provide signals to each other through scan lines. Each scan driver can be a shift register, each stage of which includes a tri-state inverter to provide its output to one of the scan lines. To transfer signals from one shift register to the other, one shift register provides signals while the outputs of the other shift register are in a floating state. The other shift register receives the signals and can then shift them to its output. The signals can be test signals used to detect defects in the shift registers and in the array. Also, each stage in each shift register is connected to receive signals from the scan line that is driven by the preceding stage. Therefore, if the preceding stage is removed due to a defect, the following stage can receive signals through the scan line from the other shift register and continue to function even though its preceding stage is removed.