Non-destructive memory testing in computers

Non-destructive memory testing in computers

In computers, a test of memory is generally performed at the time of powering up. In one form of the invention, this type of test is run on part of Random Access Memory (RAM), while allowing data or a program to reside in another part. Then, after the partial test is completed, the data is transferr...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: KASS, WILLIAM J, HILLEY, MICHAEL R
Format: Patent
Sprache:eng
Schlagworte:
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PHYSICS
STATIC STORES
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Beschreibung
Zusammenfassung:In computers, a test of memory is generally performed at the time of powering up. In one form of the invention, this type of test is run on part of Random Access Memory (RAM), while allowing data or a program to reside in another part. Then, after the partial test is completed, the data is transferred into the RAM just tested, and the RAM which previously held the data is tested. Thus, the data can co-exist in memory while the test runs, by being shuttled from one location to another.