Adaptor for fitting to a device for measuring depressions, rises and waving conditions on a surface

An adaptor for attachment to a statistical process control depth measuring device for use in detecting surface defects. The adaptor includes an attachment end for attachment to the sensor end of the measuring device and a contact end for placement on the surface being examined. A hollow shaft defined along the long axis of the adaptor and centrally located allows for disposition of the sensor end and passage of the sensing probe. The sensing probe extends selectively beyond the contact end of the adaptor. Accessory stabilizing attachments for fitting to the contact end of the adaptor are optionally provided. The adaptor is constructed of either a metal or a polymerized material. In combination with the measuring device, the assembly allows for detection of depressions, surface rises, and waving conditions on many surfaces.