Semiconductor chip test jig

A semiconductor chip test jig for testing a chip 10 with "gull-wing" leads 11 comprises a body 20 and a cover 30. The body 20 has sets of fins or combs 23 which engage with the leads 11 to locate the chip 10 in the horizontal plane; the cover 30 has a set of "knife-edge" lead sup...

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Bibliographische Detailangaben
Hauptverfasser:	MEIKLEJOHN, GEORGE A, ARMSTRONG, ROSS L
Format:	Patent
Sprache:	eng
Schlagworte:	CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR ELECTRICITY MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS PRINTED CIRCUITS TESTING
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Beschreibung
Zusammenfassung:	A semiconductor chip test jig for testing a chip 10 with "gull-wing" leads 11 comprises a body 20 and a cover 30. The body 20 has sets of fins or combs 23 which engage with the leads 11 to locate the chip 10 in the horizontal plane; the cover 30 has a set of "knife-edge" lead supports 35 formed to match a trim and form jig in the region of the leads 11 from where they emerge from the encapsulation of the chip 10 to their first bends; and the body 20 has a set of spring-loaded pins 24 which contact the leads opposite the lead supports.