Apparatus for near surface nondestructive eddy current scanning of a conductive part using a multi-layer eddy current probe array

An apparatus for near surface, nondestructive eddy current scanning of a conductive part using a multi-layer eddy current probe array. Such structures of this type, generally, employ an ultra-thin, flexible, film-like, multi-layer eddy current probe array which is adapted to provide routine inspecti...

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Bibliographische Detailangaben
Hauptverfasser:	CHARLES, RICHARD J, HEDENGREN, KRISTINA H. V, KORNRUMPF, WILLIAM P
Format:	Patent
Sprache:	eng
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
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Beschreibung
Zusammenfassung:	An apparatus for near surface, nondestructive eddy current scanning of a conductive part using a multi-layer eddy current probe array. Such structures of this type, generally, employ an ultra-thin, flexible, film-like, multi-layer eddy current probe array which is adapted to provide routine inspection of conductive parts while also providing improved signal integrity, signal transmission and isolation.