PROCESS AND CIRCUIT TO DETERMINE ESTIMATES OF THE INSTANTANEOUS VALUE OF PARAMETERS OF AT LEAST ONE SINUSOIDAL SIGNAL WITH CONSTANT AND KNOWN FREQUENCY WHICH IS AN ADDITIVE COMPONENT OF A MEASURING SIGNAL

PROCESS AND CIRCUIT TO DETERMINE ESTIMATES OF THE INSTANTANEOUS VALUE OF PARAMETERS OF AT LEAST ONE SINUSOIDAL SIGNAL WITH CONSTANT AND KNOWN FREQUENCY WHICH IS AN ADDITIVE COMPONENT OF A MEASURING SIGNAL

A circuit and method for iteratively estimating Fourier coefficients of one or more Fourier components of a measuring signal utilizes a filter to determine the Fourier coefficients for sampling time k-1. The coefficients are utilized to obtain an estimate of the measuring signal at sampling time k....

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: TOEDTLI, JUERG, GRUBER, PETER
Format: Patent
Sprache:eng
Schlagworte:
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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Beschreibung
Zusammenfassung:A circuit and method for iteratively estimating Fourier coefficients of one or more Fourier components of a measuring signal utilizes a filter to determine the Fourier coefficients for sampling time k-1. The coefficients are utilized to obtain an estimate of the measuring signal at sampling time k. A subtractor circuit subtracts an actual sample of the measuring signal at sampling time k from the estimate of the measuring signal at sampling time k to obtain a difference signal. The difference signal is inputted back into the filter to determine an estimate of the Fourier coefficients at sampling time k.