Ultra-small sample analyzer for internal reflection spectroscopy

An ultra-small sample analyzer for internal reflection spectrometry comprises a small hemispherical crystal of an infrared-transparent hard material whose flat surface receives the sample to be analyzed. The analyzing beam is contracted to a very small size when incident on the hemispherical surface...

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Bibliographische Detailangaben
Hauptverfasser:	MILOSEVIC, MILAN, HARRICK, NICOLAS J
Format:	Patent
Sprache:	eng
Schlagworte:	COLORIMETRY INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT MEASURING PHYSICS RADIATION PYROMETRY TESTING
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Beschreibung
Zusammenfassung:	An ultra-small sample analyzer for internal reflection spectrometry comprises a small hemispherical crystal of an infrared-transparent hard material whose flat surface receives the sample to be analyzed. The analyzing beam is contracted to a very small size when incident on the hemispherical surface. Pressure-applying means of a size substantially matching that of the beam at the sampling surface enables interaction of substantially the entire beam with the sample producing spectra of high contrast from microgram or nanogram quantities of the sample.