APPARATUS FOR MEASURING THERMAL DIMENSIONAL CHANGE OF CERAMICS OR THE LIKE

Bibliographische Detailangaben

Hauptverfasser:	HISANARI, TOSHIAKI, FUJIWARA, TEIICHI, MIMURA, TOSHISADA
Format:	Patent
Sprache:	eng
Schlagworte:	ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR PHYSICS TARIFF METERING APPARATUS TESTING
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