DEVICE AND METHOD FOR ANALYZING IONS OF HIGH MASS

DEVICE AND METHOD FOR ANALYZING IONS OF HIGH MASS

Detector device for analyzing ions of high mass using a time-of-flight (TOF) analytical method, consisting of a mass spectrometer 1, accelerating electrodes 2 and a magnetic field and/or electric field, all of which serves to deflect secondary ions 5 emerging from a first conversion dynode 8, so tha...

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Bibliographische Detailangaben
Hauptverfasser: GIESSMANN, ULRICH-PETER, HILLENKAMP, FRANZ, KARAS, MICHAEL
Format: Patent
Sprache:eng
Schlagworte:
BASIC ELECTRIC ELEMENTS
ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
ELECTRICITY
MEASUREMENT OF NUCLEAR OR X-RADIATION
MEASURING
PHYSICS
TESTING
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Beschreibung
Zusammenfassung:Detector device for analyzing ions of high mass using a time-of-flight (TOF) analytical method, consisting of a mass spectrometer 1, accelerating electrodes 2 and a magnetic field and/or electric field, all of which serves to deflect secondary ions 5 emerging from a first conversion dynode 8, so that the secondary ions impinge according to polarity on a second 7 and third 7' conversion dynode.