Scan path circuit

A scan path circuit, to be integrally inserted in an arbitrary place of a logic circuit, for detecting faults of the logic circuit. The scan path circuit includes: a first switch connected to a data-in for receiving data from the logic circuit; a second switch connected to the first switch and to a...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	CHUJO, NAOYA
Format:	Patent
Sprache:	eng
Schlagworte:	CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
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