Method and apparatus for parameter measurement of coupled-dual resonator crystals

Method and apparatus for parameter measurement of coupled-dual resonator crystals

In coupled-dual resonator crystals, key parameters, such as resonator frequencies and synchronous peak separation frequency, are determined using a four frequency measuring process and apparatus wherein additional impedance is connected in parallel with the driving point impedance of the input reson...

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Hauptverfasser: TOLIVER, SAMUEL, ROBERTS, GERALD E
Format: Patent
Sprache:eng
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MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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creator TOLIVER
SAMUEL
ROBERTS
GERALD E
description In coupled-dual resonator crystals, key parameters, such as resonator frequencies and synchronous peak separation frequency, are determined using a four frequency measuring process and apparatus wherein additional impedance is connected in parallel with the driving point impedance of the input resonator so as to allow the measurement of the critical frequencies above about 45 MHz.
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subjects MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
title Method and apparatus for parameter measurement of coupled-dual resonator crystals
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