Method and apparatus for parameter measurement of coupled-dual resonator crystals
In coupled-dual resonator crystals, key parameters, such as resonator frequencies and synchronous peak separation frequency, are determined using a four frequency measuring process and apparatus wherein additional impedance is connected in parallel with the driving point impedance of the input reson...
Gespeichert in:
Hauptverfasser: | , , , |
---|---|
Format: | Patent |
Sprache: | eng |
Schlagworte: | |
Online-Zugang: | Volltext bestellen |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
Zusammenfassung: | In coupled-dual resonator crystals, key parameters, such as resonator frequencies and synchronous peak separation frequency, are determined using a four frequency measuring process and apparatus wherein additional impedance is connected in parallel with the driving point impedance of the input resonator so as to allow the measurement of the critical frequencies above about 45 MHz. |
---|