Method for deposition of silicon oxide on a wafer

A processing apparatus and method for depositing a silicon oxide layer on a temperature sensitive wafer utilizing a single process chamber provide nitrous oxide gas to the chamber with the excitation energy being provided by a remotely generated plasma while supplying silane gas in combination with...

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Hauptverfasser: FREEMAN, DEAN W, SMITH, PATRICIA B, DAVIS, CECIL J, LUTTMER, JOSEPH D
Format: Patent
Sprache:eng
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Zusammenfassung:A processing apparatus and method for depositing a silicon oxide layer on a temperature sensitive wafer utilizing a single process chamber provide nitrous oxide gas to the chamber with the excitation energy being provided by a remotely generated plasma while supplying silane gas in combination with illuminating the wafer with an in situ generated ultraviolet energy to produce the silicon oxide layer.